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This paper presents the design, simulation and experimental validation of a gradient-index (GRIN) metasurface lens operating at 8 GHz for microwave imaging applications. The unit cell of the metasurface consists of an electric-LC (ELC) resonator. The effective refractive index of the metasurface is controlled by varying the capacitive gap at the center of the unit cell. This allows the design of a gradient index surface. A one-dimensional gradient index lens is designed and tested at first to describe the operational principle of such lenses. The design methodology is extended to a 2D gradient index lens for its potential application as a microwave imaging device. The metasurface lenses are designed and analyzed using full-wave finite element (FEM) solver. The proposed 2D lens has an aperture of size 119 mm (3.17λ) × 119 mm (3.17λ) and thickness of only 0.6 mm (0.016λ). Horn antenna is used as source of plane waves incident on the lens to evaluate the focusing performance. Field distributions of the theoretical designs and fabricated lenses are analyzed and are shown to be in good agreement. A microwave nondestructive evaluation (NDE) experiment is performed with the 2D prototype lens to image a machined groove in a Teflon sample placed at the focal plane of the lens. 

Metamaterials are engineered periodic structures designed to have unique properties not encountered in naturally occurring materials. One such unusual property of metamaterials is the ability to exhibit negative refractive index over a prescribed range of frequencies. A lens made of negative refractive index metamaterials can achieve resolution beyond the diffraction limit. This paper presents the design of a metamaterial lens and its use in far-field microwave imaging for subwavelength defect detection in nondestructive evaluation (NDE). Theoretical formulation and numerical studies of the metamaterial lens design are presented followed by experimental demonstration and characterization of metamaterial behavior. Finally, a microwave homodyne receiver-based system is used in conjunction with the metamaterial lens to develop a far-field microwave NDE sensor system. A subwavelength focal spot of size 0.82λ was obtained. The system is shown to be sensitive to a defect of size 0.17λ × 0.06λ in a Teflon sample. Consecutive positions of the defect with a separation of 0.23λ was resolvable using the proposed system.